BeCe™ BIS Offers Testing
Solutions For:

  •  WLCSP, fcBGA, DSP and QFN
  •  HTOL Burn-in-Test
BeCe™ BIS – Burn In Test Socket

BeCe™ BIS are made of high-performance plastics and aluminum alloy body with special treatment to provide high strength with compact overall sizes. BeCe™ contact buttons assure high test yields with lower test costs.

Features

  • Signal path < 1.1 mm
  • Fine Pitch 0.35 mm and above
  • Contact force, < 20-30 g/pin
  • Inductance , < 0.6 nH
  • Temperature range , -45 to 135C
  • Suitable for HTOL burn-in test